Crucial tasks in forensics include the microscopic analysis of very small objects in order to accurately verify the source of specific compounds within a sample, or to compare the properties of several samples. WITec imaging systems enable comprehensive sample analysis to provide a thorough characterization of the physical and chemical properties of various samples in forensics. Confocal Raman imaging for example is a very effective tool for these investigations as it provides information on the chemical composition as well as the spatial distribution of the components. The samples typically do not require specific sample preparation and remain unaltered for further investigations with other methods due to Raman imaging being a non-destructive, non-contact and non-contaminating analysis technique.
WITec’s highly versatile instruments can combine various imaging techniques to significantly increase the insights provided by measurement results. Possible combinations which can be included in a single microscope setup include confocal Raman imaging, Atomic Force Microscopy (AFM), Nearfield-Microscopy (SNOM) and Scanning Electron Microscopy (SEM). Confocal Raman imaging provides chemical information, AFM detects topography, structure, and physical properties such as stiffness, adhesion, etc. of the sample’s surface, and SNOM high-resolution measurements can optically reach beyond the diffraction limit. All WITec instrument configurations can be upgraded at any point to adapt the system to new or extended requirements.