alpha300 RS

alpha300 RS – Correlative Raman and Scanning Near-field Optical Microscopy

  • For the user with challenging experimental requirements, the alpha300 RS facilitates confocal Raman imaging in combination with Scanning Near-field Optical Microscopy for optical imaging with resolution beyond the diffraction limit. It combines all features of the alpha300 S and alpha300 R and many AFM operation modes. Furthermore the combined Raman-SNOM microscope is ideally suited for high-resolution Raman imaging techniques such as nearfield-Raman imaging.

  • alpha300S transparent

Key Features

    • All features of the alpha300 R (Raman) and the alpha300 S (SNOM) microscope provided in one instrument
    • Excellent combination of high-resolution surface imaging (SNOM) and chemical imaging (Raman)
    • Ideally suited for combined techniques such as near-field Raman imaging
    • Convenient switching between the measurement techniques is realized by a rotation of the objective turret
    • Sample movement between the measurements not necessary

Application Example

  • alpha300RS Nearfield Raman Graphene
    Left: Topography image of exfoliated graphene simultaneously determined during the nearfield-Raman measurement with corresponding topography curve measured along the blue line. Right: Nearfield-Raman image of the same sample area of the G-band intensity with corresponding intensity graph measured along the red line.

Specifications

  • Raman General Operation Modes

    • Raman spectral imaging: acquisition of a complete Raman spectra at every image pixel
    • Planar (x-y-direction) and depth scans (z-direction) with manual sample positioning
    • Image stacks: 3D confocal Raman imaging
    • Time series
    • Single point Raman spectrum acquisition
    • Single-point depth profiling
    • Fibre-coupled UHTS spectrometer specifically designed for Raman microsopy and applications with low light intensities
    • Confocal Fluorescence Microscopy
    • Bright Field Microscopy

    SNOM Operation Modes

    • Scanning Near-field Optical Microscopy (SNOM) modes: bottom up and top down mode, collection mode
    • Confocal Microscopy (CM) modes:
      • Transmission
      • Reflection
      • Fluorescence (optional)
      • SNOM-AFM combinations: AFM operation modes of alpha300 A included or optional available
      • Acquisition of force-distance curves and light-distance curves
      • Fixed-bottom illumination
      • Total internal reflection illumination (optional)

    AFM Operation Modes

    • Contact Mode
    • Lateral Force Mode
    • others optional

  • Basic Microscope Features

    • Research grade optical microscope with 6x objective turret
    • Video system: video CCD camera
    • High sensitivity b/w video camera to view sample and SNOM/AFM tip in transmission
    • LED white-light source for Köhler illumination of AFM tip and sample
    • Manual sample positioning in x- and y-direction
    • Microscope base with active vibration isolation system
    • Fibre coupling

    Raman Optional/Upgradable Operation modes

    • Additional lasers, several wavelenghts eligible
    • Additional UHTS-spectrometers (UV, VIS, NIR)
    • Automated, motorized sample positioning and measuring with piezo-driven scan stages
    • Automated confocal Raman imaging
    • Automated multi-area and multi-point measurements
    • Ultrafast Raman imaging (1300 spectra per second) optionally available
    • Upgradable for epi-fluorescence applications
    • Adapter for higher samples 
    • TrueSurface for Raman depth profiling
    • Autofocus

    Computer Interface

    • WITec software for instrument and measurement control, data evaluation and processing

Literature

Contact

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