alpha300 RS

alpha300 RS – Correlative Raman and Scanning Near-field Optical Microscopy

  • For the user with challenging experimental requirements, the alpha300 RS facilitates confocal Raman imaging in combination with Scanning Near-field Optical Microscopy for optical imaging with resolution beyond the diffraction limit. It combines all features of the alpha300 S and alpha300 R and many AFM operation modes. Furthermore the combined Raman-SNOM microscope is ideally suited for high-resolution Raman imaging techniques such as nearfield-Raman imaging.

  • alpha300S transparent

Key Features

    • All features of the alpha300 R (Raman) and the alpha300 S (SNOM) microscope provided in one instrument
    • Excellent combination of high-resolution surface imaging (SNOM) and chemical imaging (Raman)
    • Ideally suited for combined techniques such as near-field Raman imaging
    • Convenient switching between the measurement techniques is realized by a rotation of the objective turret
    • Sample movement between the measurements not necessary

Application Example

  • alpha300RS Nearfield Raman Graphene
    Left: Topography image of exfoliated graphene simultaneously determined during the nearfield-Raman measurement with corresponding topography curve measured along the blue line. Right: Nearfield-Raman image of the same sample area of the G-band intensity with corresponding intensity graph measured along the red line.


  • Raman General Operation Modes

    • Raman spectral imaging: acquisition of a complete Raman spectra at every image pixel
    • Planar (x-y-direction) and depth scans (z-direction) with manual sample positioning
    • Image stacks: 3D confocal Raman imaging
    • Time series
    • Single point Raman spectrum acquisition
    • Single-point depth profiling
    • Fibre-coupled UHTS spectrometer specifically designed for Raman microsopy and applications with low light intensities
    • Confocal Fluorescence Microscopy
    • Bright Field Microscopy

    SNOM Operation Modes

    • Scanning Near-field Optical Microscopy (SNOM) modes: bottom up and top down mode, collection mode
    • Confocal Microscopy (CM) modes:
      • Transmission
      • Reflection
      • Fluorescence (optional)
      • SNOM-AFM combinations: AFM operation modes of alpha300 A included or optional available
      • Acquisition of force-distance curves and light-distance curves
      • Fixed-bottom illumination
      • Total internal reflection illumination (optional

    AFM Operation Modes

    • Contact Mode
    • Lateral Force Mode
    • others optional
  • Basic Microscope Features

    • Research grade optical microscope with 6x objective turret
    • Video system: video CCD camera
    • High sensitivity b/w video camera to view sample and SNOM/AFM tip in transmission
    • LED white-light source for Köhler illumination of AFM tip and sample
    • Manual sample positioning in x- and y-direction
    • Microscope base with active vibration isolation system
    • Fibre coupling

    Raman Optional/Upgradable Operation modes

    • Additional lasers, several wavelenghts eligible
    • Additional UHTS-spectrometers (UV, VIS, NIR)
    • Automated, motorized sample positioning and measuring with piezo-driven scan stages
    • Automated confocal Raman imaging
    • Automated multi-area and multi-point measurements
    • Ultrafast Raman imaging (1300 spectra per second) optional available
    • Upgradable for epi-fluorescence applications
    • Adapter for higher samples 
    • TrueSurface for Raman depth profiling
    • Autofocus

    Computer Interface

    • WITec software for instrument and measurement control, data evaluation and processing



  • Please fill in all data fields to ensure we can process your inquiry as quickly as possible.

    Privacy Protection Statement:
    WITec respects privacy of any personal information provided by visitors of our site. The personal information we collect from you within this contact form, will only be used to respond to your submitted query.