alpha300 RS – Correlative Raman and Scanning Near-field Optical Microscopy
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For the user with challenging experimental requirements, the alpha300 RS facilitates confocal Raman imaging in combination with Scanning Near-field Optical Microscopy for optical imaging with resolution beyond the diffraction limit. It combines all features of the alpha300 S and alpha300 R and many AFM operation modes. Furthermore the combined Raman-SNOM microscope is ideally suited for high-resolution Raman imaging techniques such as nearfield-Raman imaging.
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Key Features
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- All features of the alpha300 R (Raman) and the alpha300 S (SNOM) microscope provided in one instrument
- Excellent combination of high-resolution surface imaging (SNOM) and chemical imaging (Raman)
- Ideally suited for combined techniques such as near-field Raman imaging
- Convenient switching between the measurement techniques is realized by a rotation of the objective turret
- Sample movement between the measurements not necessary
Application Example
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Left: Topography image of exfoliated graphene simultaneously determined during the nearfield-Raman measurement with corresponding topography curve measured along the blue line. Right: Nearfield-Raman image of the same sample area of the G-band intensity with corresponding intensity graph measured along the red line.
Specifications
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Raman General Operation Modes
- Raman spectral imaging: acquisition of a complete Raman spectra at every image pixel
- Planar (x-y-direction) and depth scans (z-direction) with manual sample positioning
- Image stacks: 3D confocal Raman imaging
- Time series
- Single point Raman spectrum acquisition
- Single-point depth profiling
- Fibre-coupled UHTS spectrometer specifically designed for Raman microsopy and applications with low light intensities
- Confocal Fluorescence Microscopy
- Bright Field Microscopy
SNOM Operation Modes
- Scanning Near-field Optical Microscopy (SNOM) modes: bottom up and top down mode, collection mode
- Confocal Microscopy (CM) modes:
- Transmission
- Reflection
- Fluorescence (optional)
- SNOM-AFM combinations: AFM operation modes of alpha300 A included or optional available
- Acquisition of force-distance curves and light-distance curves
- Fixed-bottom illumination
- Total internal reflection illumination (optional)
AFM Operation Modes
- Contact Mode
- Lateral Force Mode
- others optional
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Basic Microscope Features
- Research grade optical microscope with 6x objective turret
- Video system: video CCD camera
- High sensitivity b/w video camera to view sample and SNOM/AFM tip in transmission
- LED white-light source for Köhler illumination of AFM tip and sample
- Manual sample positioning in x- and y-direction
- Microscope base with active vibration isolation system
- Fibre coupling
Raman Optional/Upgradable Operation modes
- Additional lasers, several wavelenghts eligible
- Additional UHTS-spectrometers (UV, VIS, NIR)
- Automated, motorized sample positioning and measuring with piezo-driven scan stages
- Automated confocal Raman imaging
- Automated multi-area and multi-point measurements
- Ultrafast Raman imaging (1300 spectra per second) optionally available
- Upgradable for epi-fluorescence applications
- Adapter for higher samples
- TrueSurface for Raman depth profiling
- Autofocus
Computer Interface
- WITec software for instrument and measurement control, data evaluation and processing
Literature
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WITec alpha300 Brochure
Open PDF(7.9 MB)
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